Testing delay faults in embedded CAMs
Xiaogang Du, Reddy, Rayhawk, Wu-Tung Cheng · 2003
Critical paths are analyzed in a CAM and minimum test patterns are proposed to detect delay faults in a CAM. The test patterns derived are shown to be covered by the basic algorithm proposed earlier in (G. Giles et al, Proc. Int. Test Conf. p.471-474, 1985).