Highly X-Tolerant Selective Compaction of Test Responses
Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer · 2009
The paper presents a new scan chain selection scheme for response compaction. The proposed solution performs selective masking of scan chains and handles a wide range of unknown state profiles, such that all X states can be eliminated in a per-cycle mode while preserving high observability of scan cells that capture errors.