Random generation of test instances for logic optimizers
Kazuo Iwama, Kensuke Hino · 1994
Abstract The attempt of using random test circuits for evaluating the performance of logic optimizers like SIS is apparently new. To generate \\reasonable " random circuits, we propose the random applications of several transformation rules to an initial circuit instead of the obvious method, random placement of connections. A preliminary experiment has been conducted on SIS's responses against such random circuits. SIS shows considerably di erent performances for di erent circuits generated from the same original circuit. 1.