IEEE Std 1500 Enables Modular SoC Testing
Erik Jan Marinissen, Y. Zorian · IEEE Design & Test of Computers · 2009
IEEE Std 1500 enables modular SoC testing, not only for core-based testing, but also for divide-and-conquer test generation and test reuse. This article provides a brief tutorial on the standard and illustrates its usage through two application case studies.