Modeling of transients caused by a laser attack on smart cards
D. Leroy, S.J. Piestrak, F. Monteiro, A. Dandache · 2005
Several techniques for extracting data from smart cards have been described in the literature, including the so called differential fault analysis (DFA) that relies on perturbing the chip operations to deduce the data. In this paper, we present some experimental results of the DFA that relies on using a laser beam.