Application of high-quality built-in test to industrial designs
Kazumi Hatayama, Michinobu NAKAO, Yoshikazu Kiyoshige, Koichiro Natsume, Yasuo Satô, T. Nagumo · 2003
This paper presents an approach for high-quality built-in test using a neighborhood pattern generator (NPG). The proposed NPG is practically acceptable because (a) its structure is independent of circuit under test, (b) it requires low area overhead and no performance degradation, and (c) it can encode deterministic test cubes, not only for stuck-at faults but also transition faults, with high probability. Experimental results for large industrial circuits illustrate the efficiency of the proposed approach.