A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis
Xinyue Fan, W. Moore, Charanpreet Singh Hora, Mario Konijnenburg, G. Gronthoud · 2006
The paper addresses the issue of transistor-level bridging fault diagnosis. While most of the previous bridging fault diagnosis work focuses on the gate-level bridging faults, this method provides a solution to intra-gate bridging faults diagnosis for the first time. Instead of using any transistor level simulation tools, we develop a transformation technique that allows transistor-level bridging faults to be diagnosed by the commonly used gate-level bridging faults diagnosis tools. Real diagnosis results from Philips designs are presented.