Mixed-mode ATPG under input constraints
Clive Glover · 2002
A pragmatic method of mixed-mode automatic test pattern generation (ATPG) which can operate under constrained inputs is presented. The author discusses fundamental modifications to traditional ATPG which allow tests to be generated for nontrivial circuits containing switch-level primitives. The program used, SPHINX, achieves reasonable fault coverages for mixed-mode circuits larger than those previously reported.>