On the selection of a partial scan path with respect to target faults
H.H.S. Gundlach, Bernd Koch, Klaus D. Müller-Glaser · European Design Automation Conference · 1991
Today the most often applied DFT-strategy is full scan path. To reduce its overhead a partial scan path can be selected. For minimizing the size of the partial scan path, existing testpatterns are used which will detect a part of the faults. Only the remaining faults, so called target faults have to be addressed using partial scan. Different methods are given to adapt a partial scan path to the target faults. They do not depend on ATPG and therefore have very short runtimes. Results on sequential ATPG-benchmarks show that a strong reduction in the size of the partial scan path is possible. >