Switch-level fault simulation for non-trivial faults based on abstract data types
Wilku B. Meyer, H.T. Vierhaus · 2002
FEHSIM, a switch-level fault simulator, is introduced. It is able to handle stuck-on and stuck-open CMOS faults as well as local bridging faults through novel concepts of internal fault propagation and network analysis. Transistor widths and lengths are taken into account to give a 'hard' detection of stuck-on faults. The switch-level model seems to strike a reasonable balance between a detailed electrical model and a simplified and abstract logical model.>