Automatic testing of microwave semiconductors
E.A. Whitman, J.A. Kelly · 2003
An automatic microwave semiconductor device tester has been developed which not only enables rapid automatic testing of a variety of microwave semiconductor devices at conditions selected by the operator, but also provides a means for processing, sorting, and storing the resulting test data. The development of the automatic test equipment (ATE) is described, along with how testing is accomplished, methods used for the storing and retrieval of test data, and other potential applications of this ATE.>