A comprehensive TCAM test scheme: An optimized test algorithm considering physical layout and combining scan test with at-speed BIST design
Hsiang-Huang Wu, Jih-Nung Lee, Ming-Cheng Chiang, Po-Wei Liu, Chi-Feng Wu · 2009
Considering the physical layout, a comprehensive TCAM test scheme divides TCAM test into test for TCAM core and test for peripheral circuit. Besides, it schedules the existing test algorithms to develop an optimized test algorithm.