Test generation for bridging faults in CMOS ICs based on current monitoring versus signal propagation
Uwe Glaser, H.T. Vierhaus, M. Kley, A. Wiederhold · 1994
Bridge-type defects play a dominant role in state-of-the-art CMOS technologies. This paper describes a combined functional and overcurrent-based test generation approach for CMOS circuits, which is optionally based on layout information. Comparative results for benchmark circuits are given to demonstrate the feasibility of voltage-based versus IDDQ-based testing. 1