A sequential redundant fault identification scheme and its application to test generation
Hsing-Chung Liang, Chung Len Lee, J.E. Chen · 2002
This work presents an efficient method to identify sequential redundant faults. The method is based on a simple procedure to identify the flip-flops which cannot be initialized and the circuit lines which cannot be controlled to definite values. The redundant faults are classified into four types and the method can identify each type of them. The method has been experimentally incorporated