An advanced data compaction approach for test-during burn-in
B. Schneider, P. Oestergaard · 2003
A novel burn-in system approach, using data compaction, test generation tools, and a flexible, general-purpose test system architecture is described. The approach offers true output monitoring of multioutput devices, featuring monitoring capabilities of 1-2000 test points per burn-in board. The approach is also well suited for testing of analog parts during burn-in, or may find usage for individual stimuli of ECL (emitter-coupled logic) parts. The strategy applies takes advantage of a flexible, general-purpose system approach-developed for this purpose-combined with the use of signature analysis approaches similar to those applied in many built-in self-test applications.>