V-Transform: An Enhanced Polynomial Coefficient Based DC Test for Non-Linear Analog Circuits
Suraj Sindia, Virendra Pal Singh, Vishwani D. Agrawal · NOT FOUND REPOSITORY (Indian Institute of Science Bangalore) · 2009
Abstract—DC testing of parametric faults in non-linear analog circuits based on a new transformation, entitled, V-Transform acting on polynomial coefficient expansion of the circuit function is presented. V-Transform serves the dual purpose of monotonizing polynomial coefficients of circuit function expansion and increasing the sensitivity of these coefficients to circuit parameters. The sensitivity of V-Transform Coefficients (VTC) to circuit parameters is up to 3x-5x more than sensitivity of polynomial coefficients. As a case study, we consider a benchmark elliptic filter to validate our method. The technique is shown to uncover hitherto untestable parametric faults whose sizes are smaller than 10 % of the nominal values. I.