An optimal march test for locating faults in DRAMs
Lin Shen, B.F. Cockburn · 2002
The authors solve the fault location problem for a realistic fault model that is based on the physical defects and resulting faulty behaviours observed in 4 Mbit DRAMs manufactured by Siemens. Assuming an n*1 DRAM organization, they derive a lower bound of 8n on the length of any march test that locates all of the faults in the fault model. They then propose a march test whose length matches the lower bound, and then show that this test has 100% fault coverage.>