TWO-PATTERN TEST CAPABILITIES OF AUTONOMOUS TPG CIRCUITS
Kiyoshi Furuya, Edward J. McCluskey · 2005
Two-pattern test capabilities of autonomous test pattern generator (TPG) circuits for use in built-in self- testing of CMOS circuits are investigated. The TPG circuits treated here are not limited to LFSRs but include arbitrary autonomous linear sequential circuits. Based on the transi- tion matrix of a circuit, a method is shown to analyze how many distinct transitions can occur on each subset of the state variables. The two-pattern test capabilities of LFSRs, cellular automata, and their fast parallel implementation are explored using transition coverage as the metric. The relationships with dual circuits and reciprocal circuits are phase shift as the metric is shown in (Bardell 901.