Testability analysis of analog systems
Gertjan Hemink, B.W. Meijer, Hans G. Kerkhoff · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1990
A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm will find sets of dependent parameters and determine whether it is possible to calculate a certain parameter with sufficient accuracy. it also determines a subset of appropriate measurements if redundant measurements are present.>