Universal Pin Electronics in portable testers
L. Parker, R.J. Koelling · 2003
The advantages of using a tester-per-pin concept in portable test stations are examined. These include: improved throughput, reduced tester size and power requirements, broadside test functions, multiport testing and reduced costs. Methods of extending digital and analog test frequencies to 75 MHz and of generating highly accurate clock subsystems are examined, along with unit-under-test (UUT) interface design considerations.>