FIESTA-EXTRA: cell-oriented software for the defect/fault analysis in VLSI circuits
A. Blyzniuk, Iryna Kazymyra · 2004
The main concepts which laid the foundation for the special software development are considered. This software tool is named FIESTA-EXTRA (Faults Identification and EStimation of TestAbility by EXTRAction of faults probabilities, kinds of faults and usefulness of test patterns for faults detection) and is developed for defect/fault analysis in the complex gates from industrial cell library. Specific features of the main three extractors of the developed software are considered. The results of the FIESTA-ExTRA approbation are described.