The detection probability computation of single stuck-at-faults in general combinational circuits
Samia Abd El-Fattah Ali · International Journal of Electronics · 1992
The detection probability problem of single faults at specified signal lines of a general combinational circuit C merits special interest. In this paper, a method is developed for such a purpose. The method has a computational complexity of O(2N), with N being the number of the non-fanout primary inputs plus the specified signal lines at the highest level of C. The applicability of the simple chain rule in the probability domain, whenever possible, is shown to reduce the computational time complexity. Moreover, all signal lines and gates within any subcircuit Ci of C with redundant output lines are shown to be redundant as well, excluding those subcircuits Cjs of Ci having fanout stems as output lines, provided that such stems do not converge in Ci