A robust test sequence for XOR trees
D.L. Tao, Carlos R. P. Hartmann, Parag K. Lala · 1989
In this paper, we propoae an algorithm to generate a robust test sequence for XOR trees constructed with hueinput CMOS XOR gates. Such a test sequence exhaustively tests each XOR gate in the tree, and provide-all robust test patterns for e& XOR gate. The propmed test sequence is independent of the implementation of tbe'XOR gates used in the XOR tree. The length of the proposed test sequence is 4d + 5, where d is equd to the height of the XOR tree plus one. Furthermore, we ahow that the number of test patterns is minimum under the wumption that there is no restriction on the implementation of the twinput XOR gab used in the XOR tree.