Technology independent boundary scan synthesis (design flow issues)
M. Robinson · 2002
A design flow paradigm that integrates technology independent boundary scan synthesis into a chip design methodology is presented. The approach accommodates multiple vendor boundary scan technologies and the requirements of (sometimes non-1149.1-compliant) user specified boundary scan architectures. Boundary scan synthesis is described and design-specific requirements, 1149.1 compliance verification, boundary scan manufacturing test, and interfacing with the board and system test environments are discussed.>