Test program development in VLSI testing
M.W.T. Wong, K.T. Cheung · 2002
This paper describes how an automatic test program generation environment is developed by making use of the Summit Design's TDS software modules as the basic building blocks. A new design-to-test process flow is defined. A solution of eliminating conversion errors of simulation post-processing is also proposed. In this approach, a functional test program can be generated within minutes, which dramatically shortens the test program development time and gets a new product faster to market.