Prototype neural network pattern recognition testbed
Steven W. Worrell, James A. Robertson, Thomas L. Varner, Charles G. Garvin · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1991
Recent successes ofneural networks has led to an optimistic outlook for neural network applications to image processing(IP). This paperpresents a general architecture for performing comparative studies of neural processing and more conventional IF techniques as well as hybrid pattern recognition (PR) systems. Two hybrid PR systems have been simulated each of which incorporate both conventional and neural processing techniques.