A Microcomputer-Controlled Testing System for Digital Integrated Circuits
Gary L. West, H. Troy Nagle, Victor P. Nelson · IEEE Transactions on Industrial Electronics and Control Instrumentation · 1980
This paper describes a low-cost digital integrated circuit (IC) tester designed and implemented using the Intel 8080 microcomputer family. Test patterns are applied to each IC to be tested from a lookup table stored in memory, along with appropriate clock signals if needed. The resulting chip outputs are then examined for errors resulting from stuck-at conditions or other functional errors. The hardware and software structure are presented as well as experimental results obtained in actual system applications.