Generating test inputs for embedded control systems
Qianchuan Zhao, Bruce H. Krogh, Peter Hubbard · IEEE Control Systems · 2003
Embedded control systems are growing rapidly, and there is a need for short design cycles. As a result, there is increasing interest in effective methods for automatic test generation. The authors present a new method for leveraging existing simulation models, involving genetic algorithms, for embedded control system designs to generate test inputs automatically, thereby eliminating the time-consuming task of creating them manually.