Markov chain dynamic representation model for reliability testing
Y. Vitaliy, Pavlo V. Serdyuk, N. Oksana · International Conference on Experience of Designing and Applications of CAD Systems in Microelectronics · 2013
In this paper we propose to use software classes as actual components and to build the control flow graph to represent software architecture using suffix tree. The proposed model of dynamic collection and storage of reliability testing data using high order Markov chains results in less memory usage than matrix representation and allows easy dynamic changes of Markov process order. As an example of the model we suggest to use new pattern based on Composite design pattern.