Redundancy, repair, and test features of a 90nm embedded SRAM generator
Robert C. Aitken, N. Dogra, D. R. Gandhi, S. Becker · 2004
Today's system on chip (SoC) designs can use hundreds of embedded memories. Most of these are created by automated generators, which must produce a wide variety of configurations while retaining essential capabilities in area, performance, power and testability. Redundancy, repair, and test issues in the context of memory generators are more complex than they are in the context of individual embedded memories, or even internally developed memories.