Linear sequential pattern classification (Corresp.)
Steven M. Smith, Stephen S. Yau · IEEE Transactions on Information Theory · 1972
A nonparametric sequential pattern classifier called a linear sequential classifier (LSC) is presented. The pattern components are measured sequentially and the decisions either to measure the next component or to stop and classify the pattern are made using linear functions derived from sample patterns based on the least mean-square error criterion. The required linear functions are computed using an adaption of Greville's recursive algorithm for computing the generalized inverse of a matrix. A recursive algorithm for computing the least mean-square error is given and is used to determine the order in which the pattern components are measured. Under the assumption of two equiprobable classes that are normally distributed with equal covariance matrices, it is shown that the LSC is equivalent to Wald's sequential probability ratio test. Computer-simulated experiments indicate that the LSC is more effective than existing nonparametric sequential classifiers.