Fault detection in EEPLA
Rochit Rajsuman, Parag K. Lala · 2003
A testing method for EEPLAs (electrically erasable programmable logic arrays) is presented. The method does not require extra hardware and provides complete fault coverage. In the proposed approach all single and multiple crosspoint faults, stuck-at faults, and bridging faults are detectable. The test set is simple and is easy to derive.>