Technology 1991: test and measurement
K. Fitzgerald · IEEE Spectrum · 1991
Developments during 1990 are highlighted. Boundary scan, a method for designing testability into microelectronics and printed-circuit boards, came to market in 1990 in an array or products ranging from application-specific ICs (ASICs) to logic analyzers. The field of communications testing was marked in 1990 by the bid of a new analysis technique, modulation domain analysis, for mainstream applications inside and outside communications, including disk-drive testing. The adoption a few years ago of a standard for the VXI (VME extensions for instrumentation) modular instrumentation bus is finally bearing fruit in a cornucopia of new products. A smart tester, incorporating artificial intelligence techniques, came on the market.>