An advanced test system architecture for synchronous and asynchronous control of mixed signal device testing
J. Kurita, N. Kasuga, K. Hiwada · 2002
The authors present a tester capable of generating and measuring real-time-managed mixed signals by means of a dual master clock and master/slave multi-sequencing. This tester can test devices under conditions very close to their real working environment. The tester thus readily enhances testing reliability and improves testing throughput promptly. A powerful software package, combined with a library-oriented application environment, eases the job of developing tests for mixed-signal devices.>