Deterministic Built-In Self-Test Using Multiple Linear Feedback Shift Registers for Low-Power Scan Testing
Lung‐Jen Lee, Wang‐Dauh Tseng, Rung‐Bin Lin, Chi-Wei Yu · 2009
Large test data volume and excessive testing power are two strict challenges for VLSI testing. This paper presents a deterministic BIST using multiple LFSRs to generate the low power test set. Experimental results show, the two problems, especially in the reduction of testing power, can be significantly improved with limited hardware overhead.