On self-testing of array systems
Wei Kang Huang, Fabrizio Lombardi · 2003
A novel self-testing method which is applicable to one- and two-dimensional arrays is presented. This method is based on a criterion referred to as GI (group identical) testability. GI testability is an extension and modification of PI (partition identical) testability and it is used to simplify response verification for self-testing. It is shown that the response verifier for PI testability does not detect all faults. A novel response verifier for GI-testable arrays is proposed. The proposed approach to self-testing has been evaluated with respect to a two-dimensional WSI (wafer scale integration) array whose cell implements the inner product step for matrix multiplication in 16 bits (integer format).>