On-chip testing of embedded programmable logic arrays
Enrico Macii, Tilman Wolf · 2002
The authors consider the problems associated with on-chip testing of programmable logic arrays (PLAs) which are deeply embedded in VLSI systems. A detailed summary of the built-in logic block observer (BILBO) approach to embedded PLA testing is given. Then, an innovative method for on-chip testing, which makes use of the input/output registers of the PLA as test aids, is presented. This method is less area-consuming than the traditional BILBO technique.>