Power Supply Noise: A Survey on Effects and Research
Mohammad Tehranipoor, Kenneth M. Butler · IEEE Design & Test of Computers · 2010
As technology scales to 32 nm and functional frequency and density continue to rise, PSN effects, which can reduce a circuit's noise immunity and could lead to failures, pose new challenges to chip manufacturers and foundries. This article provides an overview of low-power and delay testing, and surveys ongoing research for analyzing and dealing with PSN effects during delay test and timing analysis.