Load-Pull Measurements Using Modulated Signals
Basim Noori, P. Hart, John Wood, Peter H. Aaen, M. Guyonnet, Michael LeFevre, Jaime A. Plá, Jeffrey K. Jones · 2006
In this paper we report a method of applying digitally modulated signals to an RF power transistor in a load-pull system. This methodology ensures that the transistor experiences realistic thermal conditions, as well as realistic electrical conditions during test. The measured data is then sliced at constant value of CCDF enabling meaningful performance comparisons to be made between devices and technologies