Generation of test sequences for current testing
Yoshio Miura, Y. Wada, K. Kinoshita · 1991
In current testing, measuring the current with a rapid clock rate is a difficult problem, because a CMOS circuit causes a dynamic current. To overcome this problem, a testing circuit which measures the current, including the dynamic current, is proposed. Moreover, the authors describe a test generation method which generates suitable test sequences for proposed circuit. Generated test sequences have the property that almost the same number of transitions occurs between each two consecutive vectors. Finally, they show some experimental results on the test generation of this method.>