Test generation for sequential circuits based on boolean function manipulation
Ho‐Yong Choi, Takashi Kohara, Nagisa Ishiura, Isao Shirakawa, Akira Motohara · Electronics and Communications in Japan (Part III Fundamental Electronic Science) · 1993
Abstract In this paper, a test generation algorithm STAR for sequential circuits based on Boolean function manipulation is presented. Based on the product machine traversal (PMT) method, which generates test patterns using breadth‐first search of state‐pairs and an implicit state enumeration method of a product machine of fault‐free and faulty machines, STAR algorithm attempts to improve the computational efficiency by introducing a mixture of breadth‐first/depth‐first traversal based on the sequential depth, improvement on the image computation, and the computation of fault‐difference functions by the symbolic single‐fault propagation method. The results of the experiments on ISCAS 89 benchmark circuits show threefold improvement on the computational time over the simple PMT method.