A serial scan test vector compression methodology
Chengwei Su, Kychin Hwang · 2002
This paper presents a serial scan test vector compression methodology for the test time reduction in a scan-based test environment. The reduction is achieved by the overlapping of two consecutive vectors. Hence, the order of test vectors determines the amount of reduction in tiem. Here, two test vector ordering algorithms, depth first greedy and coalesced simple orders algorithms, have been derived, implemented, and tested. Experimental results obtained are very close to estimations by statistical analysis.>