A self-test and self-diagnosis architecture for boards using boundary scans
Ling Wang, M. Marhoefer, Edward J. McCluskey · 2003
The authors present a low-cost self-test and self-diagnosis architecture for locating both defective chips and bad interconnects on a printed-circuit board. It is assumed that the boundary scan method developed by the Joint Task Action Group (JTAG) is applied to all chips on the board. To achieve high fault coverage, the proposed method uses pseudorandom patterns from a cellular automaton to locate defective chips, and walking sequences to locate bad interconnects. It is shown that the effectiveness of this method depends on the type of circuits to be tested.>