Applications of on-chip samplers for test and measurement of integrated circuits
Ron Ho, Bharadwaj S. Amrutur, Ken Mai, B. Wilburn, Toshihiko Mori, Mark Horowitz · 2002
Displaying the real-time behavior of critical signals on VLSI chips is difficult and can require expensive test equipment. We present a simple sampling technique to display the analog waveforms of high bandwidth on-chip signals on a laboratory oscilloscope. It is based on the subsampling of periodic signals. This circuit was used to verify the operation of a recent low-power SRAM design.