A partitioning method for achieving maximal test concurrency in pseudo-exhaustive testing
R. Srinivasan, Charles A. Njinda, M.A. Breuer · 2002
Pseudo-exhaustive testing of combinational circuits usually requires multiple test sessions and/or more than a minimum number of test signals, i.e. unique input sequences. This paper presents a methodology for partitioning combinational circuits such that they can be pseudo-exhaustively tested with a minimal number of test signals in a single test session. Circuits are logically partitioned during test mode and unrelated inputs are combined to achieve maximal test concurrency.>