Design and test strategy for differential cascode voltage switch circuits
D.M. Wu, J.W. Davis, Nils Thoma · Third Annual IEEE Proceedings on ASIC Seminar and Exhibit · 2002
A test methodology for the differential cascode voltage switch (DCVS) is described. The design methodology of DCVS makes it more testable compared to other technologies. In testing DCVS, a precharge state always precedes a test pattern or a functional pattern. This test methodology permits detection of delay faults and stuck-open faults. The good circuit outputs of a logic tree are orthogonal. A high percentage of defects can be detected through the XOR gate designed for testing nonorthogonal faults.>