On Obtaining Maximum-Length Sequences for Accumulator-Based Serial TPG
Dimitri Kagaris, P. Karpodinis, Dimitrios Nikolos · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2006
Arithmetic-function modules, which are available in many circuits, can be utilized to generate test patterns and compact test responses. An accumulator-based scheme along with a procedure to find maximum-length nonlinear sequences for bit-serial test-pattern generators is proposed. The proposed scheme achieves good fault coverage with low hardware overhead and short test sequences