An efficient interconnect test using BIST module in a boundary-scan environment
Hyun Jin Kim, Jongchul Shin, Sungho Kang · 2003
In this paper, an efficient built-in self-test (BIST) method for applying tests is developed without collisions of the test data in three-state nets in a system. A new interconnect test algorithm in multiple boundary scan chains and a BIST module based on the new BIST method are presented. The new algorithm can be easily applied to any net configurations with high flexibility.