Calculation of multiple sets of weights for weighted random testing
M. Bershteyn · 2002
Two novel algorithms are presented for calculation of input weights used during weighted random testing. One of them is based on circuit structure analysis, the other one uses pre-generated test patterns to compute weights. These methods provide random tests with high fault coverage and a small number of test vectors. They can be used both for BIST and for external testing of VLSI.>