Next generation test generator (NGTG) for analog circuits
Larry Venetsky, S. Singer · 2002
This paper describes a system that automatically generates tests for an analog Unit Under Test (UUT) in learning mode, and then deploys the system for fault detection and isolation in the production mode. The NGTG consists of the following main components: a) minimized input test pattern generator, b) UUT simulator, and last but not least c) evaluation system. The NGTG is a process that utilizes Fuzzy Artmap neural network for fault diagnostics and detection and genetic algorithm for test generation and fault coverage optimization.